Published September 11, 2025 | Version v1
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MFMET II A3.2.1: literature survey on requirements and procedures with regard to leakage in a range 30 °C < T < 75 °C

  • 1. ROR icon Instituto Português Da Qualidade
  • 2. ROR icon Danish Technological Institute
  • 3. ROR icon National Laboratory for Civil Engineering
  • 4. ROR icon Instituto de Engenharia de Sistemas e Computadores Microsistemas e Nanotecnologias

Description

This report was written as part of activity A3.2.1 from the EPM Establishing Metrology Standards in Microfluidic Devices (MFMET II) project. The three-year European project commenced on 1st June 2025, please visit https://mfmet.eu

Activity number

Activity description

Participants (Lead in bold)

A3.2.1

M03

LNEC with support from INESC MN, DTI and IPQ will carry out a literature survey on requirements and procedures with regard to leakage in a range 30 °C < T < 75 °C. The main focus will be on the specifications for various (microfluidic chip) materials and the impact of increasing the temperatures (e.g. variability in leakage rates).

LNEC, INESC MN, DTI, IPQ

Files

MFMET II A3.2.1 - Literature survey on leakage at high temperature.pdf

Additional details

Dates

Accepted
2025-09-11