Published July 31, 2025
| Version v1
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ASINA Dataset: LC2_Pchem
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Description
The dataset captures the surface chemical characterization of NEPs. XPS is used to analyze surface composition, detecting elemental presence and chemical states. The element name, binding energy, R.S.F, FWHM of XPS peaks are recorded providing insights into chemical uniformity and % atomic concentration of the distribution of elements on the sample surface.
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Additional details
Related works
- Has metadata
- 10.5281/zenodo.16640872 (DOI)