Advanced Characterization of Al-Doped Photocatalyst

The development of aluminum (Al)-doped photocatalysts has garnered significant attention due to their enhanced photocatalytic activity, improved charge separation, and tunable bandgap properties for applications in environmental remediation and energy conversion. This study focuses on the advanced characterization of Al-doped photocatalysts using techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), UV-Vis diffuse reflectance spectroscopy (DRS), and photoluminescence (PL) spectroscopy. The results demonstrate that Al doping modifies the crystal structure, surface morphology, and optical properties, leading to improved photocatalytic efficiency under visible light. Furthermore, electrochemical impedance spectroscopy (EIS) and transient photocurrent response analyses reveal enhanced charge carrier separation and reduced recombination rates. The findings provide critical insights into the role of Al doping in optimizing photocatalytic performance, offering a pathway for designing high-efficiency photocatalysts for sustainable applications.