Datasets for "3D Atomic-Scale Metrology of Strain Relaxation and Roughness in Gate-All-Around Transistors via Electron Ptychography"
Description
Through-focal series, 4D-STEM datasets and reconstructed phase stacks associated with the paper "3D Atomic-Scale Metrology of Strain Relaxation and Roughness in Gate-All-Around Transistors via Electron Ptychography." This repository includes the raw MEP datasets, MEP reconstructed phase stacks, and through-focal comparison images (iDPC and ADF). The reconstruction code is based on the fold_slice package (https://github.com/yijiang1/fold_slice), with tilt propagator extension (courtesy of Lopa Bhatt, Muller Group). A copy of the code is included with an example script and parameters to reproduce the reconstructions. Jupyter notebooks used for atom tracking, 3D interface shape extraction, and strain/roughness analysis are also provided.
Note (August 21, 2026): The filenames of the two GAA 4D-STEM datasets (HDF5 files) were inadvertently interchanged. SupFig9c_MEP_GAA1.hdf5 corresponds to GAA device 2, and SupFig9d_MEP_GAA2.hdf5 corresponds to GAA device 1. This affects the filenames only; the datasets themselves are unchanged.
READ_ME.txt
Files
01_Planar_Interface_atom_tracking.ipynb
Files
(18.2 GB)
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Additional details
Related works
- Is supplement to
- Publication: 10.1038/s41467-026-69733-1 (DOI)