Published February 6, 2023
| Version v1
Dataset
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[AFM] 250nm Sawtooth Si substrate - Magnetization reversal mechanisms in highly corrugated thin films
Authors/Creators
- 1. Universidad de Castilla-La Mancha (UCLM)
Description
AFM characterization (raw and processed images and profile data) of ST Si wafers. It shows 250nm lateral periodicity and roughly 160nm in ripple amplitude.
Files
VGroove_S02_RDG_00057_Mean_Profile.png
Additional details
Related works
- Is described by
- Journal article: 10.1063/5.0129869 (DOI)