Dataset for Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Hoffmann, Johannes; de Preville, Sophie; Eckmann, Bruno; Lin, Hung-Ju; Herzog, Benedikt; Haddadi, Kamel; Theron, Didier; Gramse, Georg; Richert, Damien; Moran-Meza, Jose; Piquemal, Francois

doi:10.1109/TIM.2024.3378310

Published May 7, 2024 | Version 1

Dataset Open

Dataset for Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

1. Swiss Federal Institute of Metrology
2. Laboratoire National de Métrologie et d'Essais

Dataset for the paper Comparison of Impedance Matching Networks for Scanning Microwave Microscopy. It contains the raw data and skripts to produce the figures shown in the paper.

Files

MatchingGraphPrep.zip

Files (73.4 MB)

Name	Size	Download all
MatchingGraphPrep.zip md5:eb518ef3c336801a96bcd19f24192598	73.4 MB	Preview Download

Additional details

European Commission
Electrical nanoscale metrology in industry EMPIR 20IND12 ELENA

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DOI

Resource type

Dataset

Publisher

Zenodo

Published in

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 73, 2024.

Languages

English

License: Creative Commons Attribution 4.0 International

The Creative Commons Attribution license allows re-distribution and re-use of a licensed work on the condition that the creator is appropriately credited. Read more

Technical metadata

Created: September 9, 2024
Modified: September 9, 2024

Dataset for Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Authors/Creators

Description

Files

MatchingGraphPrep.zip

Files (73.4 MB)

Additional details

Funding