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Published January 1, 1999 | Version v1
Journal article Open

On-wafer measurements of noise temperature

Authors/Creators

  • Randa, J.
  • Billinger, Robert L.
  • Rice, John L.

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n/a

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DOI
10.1109/19.816146
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10.1109/19.816146

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Created
June 4, 2018
Modified
August 2, 2024

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