Establishing Metrology Standards in Microfluidic Devices
Published May 27, 2024 | Version v1
Report Open

MFMET A5.1.7. Report on reasons for failure of microfluidic devices

Creators

  • 1. Hahn-Schickard
  • 2. ROR icon enablingMNT (Germany)
  • 3. ROR icon Danish Technological Institute
  • 4. ROR icon Instituto Português Da Qualidade
  • 5. IMTAG
  • 6. CEA
  • 7. ROR icon Instituto de Engenharia de Sistemas e Computadores Microsistemas e Nanotecnologias

Description

This document provides the investigation on why microfluidic devices fail.

Activity No. 

(where applicable) 

5.1.7 

Brief Activity Description 

A report highlighting how and why microfluidic devices fail will be produced including a checklist that can be used by the full microfluidic supply chain. This report/paper will be made available on the project website and distributed to the microfluidic community and other potential end users by email. 

Action by whom 

Hahn-Schickard (Lead), all partners 

Due by 

M36 

 

1.       Links to other relevant reports

·       MFMET A1.2.3 Documented example of the test protocol for leakage and burst pressure. Link

·       MFMET A3.2.7 Documented example of surface roughness measurements. Link

·       MFMET A2.2.2 Development of test protocols for microfluidic devices. Link

·       MFMET A2.3.2 Test protocols for liquid properties related to microfluidic devices. Link

·       MFMET A2.1.1 Metrology Methodology. Link

Files

MFMET A5.1.7. Report on reasons for failure of microfluidic devices.pdf

Files (419.5 kB)