Published February 27, 2024
| Version v2
Dataset
Open
Carinthia dataset
Creators
- 1. KAI - Kompetenzzentrum Automobil- und Industrieelektronik GmbH
- 2. Infineon Technologies Dresden GmbH & Co. KG
- 3. Infineon Technologies Austria AG
Description
The Carinthia dataset contains Scanning Electron Microscope (SEM) images of defects found on one production layer of unstructured semiconductor wafers. The dataset consists of 4,591 images unevenly distributed in six defect classes. The dataset's description is available in the 'carinthia_dataset.html' file, and the images themselves can be found in the 'data.zip' file.
Files
data.zip
Files
(136.4 MB)
| Name | Size | Download all |
|---|---|---|
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md5:7ac95f3ef725c5fb03823f6e53f020b6
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2.6 MB | Download |
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md5:457011cf9063e5a49751f33ea468309d
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133.8 MB | Preview Download |