Microscopic defect dynamics during a brittle-to-ductile transition

Description of Data employed in “Microscopic defect dynamics during a brittle-to-ductile transition”-

The data reported in Table S.1 of PNAS paper is as follows :

1. All raw data [mechanical synchronized with ultrasonic probes ] are in .mat files.
2. The data includes both strain, stress, P-velocityand waveforms of passive sensor in the point of strain-stress also are provided . All data are in 2ns time-resolution –
3. AE_CAT_xxx includes all information recorded during test in Paterson rig. The data are synchronized with pulsing (active) and passive excitations based on simple off-line synchronized matching ;
4. The index the AE_CAT_xxx table doe have a corresponding waveforms due to an AE in M_xxx
5. UM_XXX are based on table S1 and does have full strain-stress data set.
6. Dist_xx_yy is distance measurement calculated based on DTW algorithm between each pair of tests

Feel free to request [ hoghaff@mit.edu or mpec@mit.edu]  further information regarding our methods of analysis the data or obtaining the waves in Paterson rig. 

**Apart of the  presented data in the paper , we repeated each test  at least twice to be confident about our results in particular  ultra-high frequency AEs and the strain-stress history.  Feel free to request data independently from corresponding authors.