Published July 22, 2017
| Version v1
Journal article
Open
MEASUREMENT SYSTEM FOR INPUT BIAS –OFFSET CURRENTS OF AN OPERATIONAL AMPLIFIER
Authors/Creators
- 1. Department of Pure and Applied Physics, Caleb University, P.M.B. 21238, Ikeja GPO, Imota, Lagos
- 2. Department of Physical Science, Yaba College of Technology, Yaba, Lagos.
Description
A very simple microprocessor (µP) -based dedicated instrument is designed here.' The Overall system design consists of both hardware and software designs. This set-up yields the exact values of input bias and input off-set currents on the µP display panel, one after the other, when the operational amplifier (OP- AMP) under test is connected across the test terminals.