Tailoring Ti Grade 2 and TNTZ alloy surfaces in a two-step mechanical-chemical modification
Authors/Creators
- 1. Warsaw University of Technilogy, Faculty of Materials Science and Engineering
- 2. Warsaw University of Technilogy, Faculty of Materials Science and Engineering, Multidisciplinary Research Centre, Cardinal Stefan Wyszynski University in Warsaw
Description
This record contains all files generated in the preparation process of the following publication:
Agnieszka Kowalczyk, Donata Kuczyńska-Zemła, Agata Sotniczuk, Klaudia Anuszewska and Halina Garbacz,
"Tailoring Ti Grade 2 and TNTZ alloy surfaces in a two-step mechanical-chemical modification", submitted to Surface Engineering.
Designations:
Ti alloy - Ti-29Nb-13Ta-4,6Zr alloy (TNTZ)
G - sample grinded on #600 grit abrasive paper
S_1,2 - sample shot peened with 90-150 µm shots, under pressure of 0.2 MPa
S_1,3 - sample shot peened with 90-150 µm shots, under pressure of 0.3 MPa
S_1,4 - sample shot peened with 90-150 µm shots, under pressure of 0.4 MPa
S_1,5 - sample shot peened with 90-150 µm shots, under pressure of 0.5 MPa
S_2,4 - sample shot peened with 150-250 µm shots, under pressure of 0.4 MPa
S_2,5 - sample shot peened with 150-250 µm shots, under pressure of 0.5 MPa
SE_1,2 - sample shot peened with 90-150 µm shots, under pressure of 0.2 MPa and etched in a solution of 3% hydrofluoric acid (HF)
SE_1,3 - sample shot peened with 90-150 µm shots, under pressure of 0.3 MPa and etched in a solution of 3% hydrofluoric acid (HF)
SE_1,4 - sample shot peened with 90-150 µm shots, under pressure of 0.4 MPa and etched in a solution of 3% hydrofluoric acid (HF)
SE_1,5 - sample shot peened with 90-150 µm shots, under pressure of 0.5 MPa and etched in a solution of 3% hydrofluoric acid (HF)
SE_2,4 - sample shot peened with 150-250 µm shots, under pressure of 0.4 MPa and etched in a solution of 3% hydrofluoric acid (HF)
SE_2,5 - sample shot peened with 150-250 µm shots, under pressure of 0.5 MPa and etched in a solution of 3% hydrofluoric acid (HF)
HV - Vickers hardness
SEM - Scanning Electron Microscopy
R - roughness
W - wettability
Folders content:
Hardness - contains files with data obtained from hardness tests using a Falcon 500 hardness tester with a Vickers indenter at a load of 1.96 N (HV0.2)
Roughness - contains files from topography analysis obtained using a Wyko NT9300 optical profilometer for various scan areas
SEM - contains images of samples surfaces from Hitachi SU8000 and Hitachi SU70 Scanning Electron Microscopes
Wettability - contains files with data obtained from wettability tests using a DataPhysics OCA 25 goniometer with the sessile drop method
This research was funded in part by National Science Centre, Poland [Grant no. 2022/45/B/ST5/03398].