Published February 16, 2023 | Version v1

IV data and TEM characterization of Cu/SiO2/W CBRAM devices

  • 1. QM-IFOX Helmholtz-Zentrum Berlin
  • 2. Department of Inorganic Chemistry, Fritz-Haber Institute of the Max-Planck Society
  • 3. CE-IF Helmholtz-Zentrum Berlin

Description

The Cycle archive folder contains the IV raw data of Cu/SiO2/W CBRAM devices. The TEM folder contains raw data of TEM microscopy and EDX measurments.

Files

Cycles.zip

Files (530.6 MB)

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md5:45ade031189684cfd77086e73252896b
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md5:d3c60cfac2bf873652f0cc9d82d81723
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Additional details

Related works

Is supplemented by
Preprint: 10.48550/arXiv.2205.00827 (DOI)