High-definition electron diffraction patterns and their indexation results of a polycrystal Al-Mg sample of various tilt angles

This dataset of 2 EBSD scans, each of 1200 high-resolution (1200×1600) electron diffraction patterns, is acquired from the same area of an unstrained polycrystal Al-Mg sample. The patterns are recorded by a Bruker eFlashHD camera mounted on Tescan MAIA3. The sample tilt angle is 60° and 65°, the step size 1.625 µm, the beam current 10 nA and the accelerate voltage 20kV. The EBSD acquisition with tilt angle 70° is shared in the link https://doi.org/10.5281/zenodo.6990325. The indexation results, in format 'mat' of Matlab, by integrated digital image correlation (IDIC EBSD) and integrated digital image correlation based on gradients (IDIC-G EBSD) are also provided. For each diffraction pattern, 6 parameters are stocked, i.e. the Euler angle triplet (expressed in radians and with reference to the EBSD detector) and the coordinates of the projection center.