Published December 31, 2022
| Version v1
Dataset
Open
Data underlying: "Method to traceably determine the refractive index by measuring the angle of minimum deviation"
Authors/Creators
- 1. VSL/Amsterdam UMC
- 2. VSL
- 3. Amsterdam UMC
Description
Datasets of refractive index measurements of fused silica measurements at 405 nm, 436 nm, 546 nm and 579 nm, published in "Method to traceable determine the refractive index by measuring the angle of minimum deviation".
Notes
This work is part of the project 18HLT01 METVES II and received funding from the EMPIR program co-financed by the Participating States and from the European Union's Horizon 2020 research and innovation program.
Files
405.zip
Files
(396.7 MB)
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md5:c76a25fa26735430a20738231963ef89
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md5:4454319a0cc06cbac63e982fe7658d72
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57.9 MB | Preview Download |
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md5:14be7f87829ea01f531edf8814feb5fe
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59.7 MB | Preview Download |
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md5:81c2e774f5d40c1b4d4e05b2ef45af83
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md5:0dd055ed683c03d378f31365fa982f32
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456 Bytes | Preview Download |
Additional details
Related works
- Has part
- Software: 10.5281/zenodo.5801199 (DOI)
- Is required by
- Journal article: 10.1088/1681-7575/ac8991 (DOI)