(CUALSE2)1-X (TASE)X ALLOY SYSTEM (0 ≤ X ≤ 0.5): X-RAY DIFFRACTION, DIFFERENTIAL THERMAL ANALYSIS AND SCANNING ELECTRON MICROSCOPY MEASUREMENTS
Authors/Creators
- 1. Centro de Estudios en Semiconductores (CES). Departamento de Física, Facultad de Ciencias, Universidad de Los Andes (ULA). Mérida, Venezuela
- 2. Universidad Centro-Occidental "Lisandro Alvarado". Barquisimeto. Venezuela
- 3. Laboratorio de Cristalografía, Dpto. Química, Facultad de Ciencias, Universidad de Los Andes. Mérida, Venezuela
- 4. Instituto de Ciencia y Tecnología de Materiales (IMRE), Universidad de La Habana, Vedado, Cuba
- 5. Department of Chemistry and Biochemistry, Duquesne University, Pittsburgh, USA
- 6. Department of Physics, Pachhunga University College, Aizawl, India-796001
Description
Polycrystalline samples belonging to the (CuAlSe2)1-x(TaSe)x alloys system, in the composition interval 0 ≤ x ≤ 0.5, were synthesized by the melt and anneal method. X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM), and Differential Thermal Analysis (DTA) techniques were used for the characterization of the products. From XRD it can be observed a chalcopyrite-like single phase in the composition range 0 ≤ x ≤ 0.1, with lattice parameters very close to CuAlSe2 and two-phases, chalcopyrite-like and hexagonal-Cu0.52TaSe2, for 0.1 < x ≤ 0.5. By SEM, the stoichiometry for all samples had been measured and the new phase was identified as (Cu0.4Al0.3)TaSe2. From DTA the respective phase transitions with temperature were obtained. Using the experimental information, a preliminary T-x phase diagram was proposed.