Published July 14, 2022 | Version Version 1
Journal article Open

Ion trap with gold-plated alumina: Substrate and surface characterization

Authors/Creators

  • 1. Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH)
  • 2. Department of Physics, Pohang University of Science and Technology (POSTECH)
  • 3. Pohang Accelerator Laboratory (PAL), Pohang University of Science and Technology (POSTECH)

Contributors

Data collector:

Project leader:

  • 1. Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH)

Description

We describe a complete development process of a segmented-blade linear ion trap. Alumina substrate is characterized with an X-ray diffraction and loss-tangent measurement. The blade is laser-micromachined and polished, followed by the sputtering and gold electroplating. Surface roughness is examined at each step of the fabrication via both electron and optical microscopies. On the gold-plated facet, we obtain a height deviation of tens of nanometers in the vicinity of the ion position. Trapping of laser-cooled 174Yb+ ions is demonstrated.

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Related works

Is cited by
10.48550/arXiv.2207.06878 (DOI)