Published July 20, 2022 | Version v2

EM-CCD noise image sequence

Authors/Creators

  • 1. Laboratorio Nacional de Microscopía Avanzada, Instituto de Biotecnología, Universidad Nacional Autónoma de Mexico

Contributors

Researcher:

  • 1. Laboratorio Nacional de Microscopia Avanzada, Instituto de Biotecnologia, Universidad Nacional Autonoma de Mexico

Description

Using a custom code written in R, an image series of EM-CCD sensor noise was simulated, based on the equations and theory provided by Hirsch and collaborators [1].

1. M. Hirsch, R. J. Wareham, M. L. Martin-Fernandez, M. P. Hobson, and D. J. Rolfe, “A stochastic model for electron multiplication charge-coupled devices – from theory to practice,” PLOS ONE 8, 1–13 (2013).

Files

EMCCD noise sequence.tif

Files (210.4 kB)

Name Size Download all
md5:3067cc4fe7a328e7dc65f29c5280ac09
210.4 kB Preview Download

Additional details

Related works

Is published in
Software documentation: 10.5281/zenodo.6836636 (DOI)
Preprint: 10.21203/rs.3.rs-984659/v1 (DOI)
Preprint: 10.1101/2021.10.17.464398 (DOI)

References

  • Esley García, Raúl Cámara, Alejandro Linares et al. Nanoscopic resolution within a single imaging frame, 29 October 2021, PREPRINT (Version 1) available at Research Square [https://doi.org/10.21203/rs.3.rs-984659/v1]
  • M. Hirsch, R. J. Wareham, M. L. Martin-Fernandez, M. P. Hobson, and D. J. Rolfe, "A stochastic model for electron multiplication charge-coupled devices – from theory to practice," PLOS ONE 8, 1–13 (2013).