X-ray diffraction dataset for experimental noise filtering

X-ray diffraction data set for the training of noise filtering algorithms. The data set contains more than 200 groups of low/high counting statistics pairs. The exposure times are mostly 2 (21) seconds for low (high) counting data. Every folder in a group consists of 41 consecutive frames with a resolution of 195 x 487 pixels and a bit-depth of 32. The text file "groups.txt" defines the names of the grouped folders containing low/high counting statistics pairs with the corresponding exposure times. The individual groups are separated by blank lines.

The data has been recorded on a La_1.88Sr_0.12CuO₄ single crystal at the beamline P21.1 at the PETRA III storage ring at DESY in Hamburg, Germany. The scattering intensities were recorded using Dectris Pilatus 100K CdTe detector. The diffractometer was operated with 100 keV photons and the sample was cooled to T ~ 30 K. The data contains different signals such as weak 2D charge density wave order, fundamental Bragg peaks, powder lines, spurions and dead pixels.