Published May 9, 2022
| Version v1
Dataset
Open
Three-dimensional in-situ imaging of single-grain growth in polycrystalline In2O3:Zr films
Authors/Creators
- 1. Division of Synchrotron Radiation Research and NanoLund, Department of Physics, Lund University, P.O. Box 118, SE-221 00 Lund, Sweden
- 2. MESA+ Institute for Nanotechnology, University of Twente, Enschede, 7500 AE, The Netherlands
- 3. Centre for X-ray and Nano Science (CXNS), Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, DE-22607 Hamburg, Germany
- 4. APS, Argonne National Laboratory, 9700 S Cass Ave, Lemont, IL 60439, United States
- 5. EPFL STI IMT PV-LAB, MC A2 238 (Bâtiment MC) Rue de la Maladière 71b, CP 526, CH-2002 Neuchâtel 2, Switzerland
Description
Original data
Here, we image a single-grain growth during the amorphous-to-polycrystalline transition in technologically relevant transparent conductive oxide (TCO) film of In2O3:Zr with in-situ Bragg coherent X-ray diffraction imaging.
Data was obtained at 34ID-C end-station at Advanced Photon Source, Argonne National Laboratory (USA).
Repository contains all raw datasets of the BCDI measurements, .spec files with corresponding meta-data, and .xlsx table with information on scan numbers related to annealing steps of the sample.