Published April 23, 2022 | Version 1.0

Data repository for "Interface rotation in Cu/Nb accumulative roll bonded (ARB) nanolaminates"

  • 1. Center for Advancing Materials Performance from the Nanoscale (CAMP-nano), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, China
  • 2. Nanyang Technological University, Temasek Laboratories@NTU, Singapore, 637553
  • 3. Aix Marseille Université, Université de Toulon, CNRS, IM2NP, Marseille, France
  • 4. Singapore University of Technology & Design (SUTD), Engineering Product Development (EPD), Xtreme Mechanics Lab, 8 Somapah Road, Singapore 487372, Singapore; nano-Micro Reliability Lab (MRL), Engineering Product Development, Singapore University of Technology and Design (SUTD), Singapore 487372, Singapore
  • 5. School of Materials Science and Engineering, Nanyang Technological University, Singapore, 639798
  • 6. nano-Micro Reliability Lab (MRL), Engineering Product Development, Singapore University of Technology and Design (SUTD), Singapore 487372, Singapore
  • 7. Singapore University of Technology & Design (SUTD), Engineering Product Development (EPD), Xtreme Mechanics Lab, 8 Somapah Road, Singapore 487372, Singapore; Department of Manufacturing and Mechanical Engineering and Technology, Oregon Institute of Technology, Klamath Falls, OR 97601, USA; Industrial Engineering Department, BINUS Graduate Program—Master of Industrial Engineering, Bina Nusantara University, Jakarta 11480, Indonesia

Description

Data repository for "Interface rotation in Cu/Nb accumulative roll bonded (ARB) nanolaminates"

This repository contains raw experimental data for "Interface rotation in Cu/Nb accumulative roll bonded (ARB) nanolaminates" manuscript. Please refer to the manuscript for the data interpretation.

The repository structure:

  • CuNbARB-sample-photo.jpg shows a photograph of as-received Cu(63nm)/Nb(63nm) accumulative roll bonded (ARB) nanolaminate sample
  • ARB_63nm_DRX contains X-ray diffraction measurements
  • RD/TDXFIBmilling folders contain focused ion beam images captured during pillar milling
    • In RDX/TDX, X refers to pillar number (see Supplementary information.org for the full pillar list). The numbers in the file names inside refer to the corresponding pillars.
  • RD/TDXSEMbefore folders contain scanning electron (SEM) images of the as-fabricated pillars
  • RD/TDX-compression folders contain in situ pillar compression data, including some of the SEM images captured before/after the compression, raw load-displacement data (in .hys native Hysitron piconindenter format), load-displacement data exported to raw text (see Supplementary information for examples how to plot load-displacement using the raw text files), SEM videos, SEM videos combined with the load-displacement data, and accelerated videos
  • RD/TDX-SEMafter folders contain SEM images of the compressed pillars
  • Supplementary-info folder contains supplementary information

Author: I. Radchenko, W. Zhu, L. Qing, E. Navarro, R. Sahay, P.S. Lee, N. Raghavan, O. Thomas, A.S. Budiman, K. Chen

Files

ARB_63nm_DRX.zip

Files (2.0 GB)

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Additional details

Related works

References
Video/Audio: 10.5281/zenodo.1289061 (DOI)