Published March 18, 2022
| Version 1.0
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Dataset of D.-H. Chae et al., Meas. Sci.Technol 33 (2022) 065012, "Investigation of the stability of graphene devices for quantum resistance metrology at direct and alternating current"
Creators
- 1. Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Republic of Korea
- 2. Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany
- 3. Czech Metrology Institute (CMI), Okružní 31, 638 00 Brno, Czech Republic
- 4. Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce, 91, 10135 Torino, Italy and Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy
- 5. Laboratoire National de Métrologie et d'Essais (LNE), 29 Avenue Roger Hennequin, 78197 Trappes, France
Description
Compilation of the datasets used to generate the figures in the following journal publication:
"Investigation of the stability of graphene devices for quantum resistance metrology at direct and alternating current"
by Dong-Hun Chae, Mattias Kruskopf, Jan Kucera, Jaesung Park, Ngoc Thanh Mai Tran, Dan Bee Kim, Klaus Pierz, Martin Götz, Yefei Yin, Pavel Svoboda, Petr Chrobok, François Couëdo and Félicien Schopfer,
Meas. Sci. Technol. 33 (2022) 065012,
DOI:10.1088/1361-6501/ac4a1a
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Related works
- Is supplement to
- Journal article: 10.1088/1361-6501/ac4a1a (DOI)