Published March 11, 2022 | Version v1
Conference paper Open

The Best of Both Worlds: Integrating Semantic Features with Expert Features for Defect Prediction and Localization

Authors/Creators

  • 1. Zhejiang University
  • 2. Huawei
  • 3. Singapore Management University

Description

This is the replication package for "The Best of Both Worlds: Integrating Semantic Features with Expert Features for Defect Prediction and Localization".

Files

JIT-Fine-replication.zip

Files (101.1 MB)

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