Example data for "Calibration of X-ray computed tomography for surface topography measurement using metrological characteristics"
Authors/Creators
- 1. University of Nottingham
- 2. University of Perugia
- 3. Technische Universität Kaiserslautern
Description
Example raw data used to create figures during the conference paper "Calibration of X-ray computed tomography for surface topography measurement using metrological characteristics", presented at euspen’s 21st International Conference & Exhibition 2020
Data in the ".datx" format are acquired using a ZYGO NexView NX2 coherence scanning interferometer.
Data in the ".stl" format are acquired using a Nikon MCT 225 X-ray computed tomography instrument.
Notes
Files
Files
(525.8 MB)
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md5:9fc3ada9292f7fc4d36b00ce8dedf444
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md5:ed5791b423cdbcdbbc41f4d149d9157c
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20.1 MB | Download |
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md5:33561671f87d796c5c6a8fd78212e432
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60.8 MB | Download |