Published September 30, 2000 | Version v1

Resonance fluorescence studies of spectroscopically pure SiO2

Description

Yeditepe University, Department of Electric and Electronics Engineering, Uskudar 81160, Istanbul, Turkey

Ankara University, Faculty of Sciences, Department of Physics, Tandogan, 06100 Ankara, Turkey

E-mail : ayaman@science.ankara.edu.tr

Ankara University, Faculty of Sciences, Department of Engineering Physics, 06100 Tandogan, Ankara, Tui key

Manuscript received 6 March 2000, revised 5 June 2000, accepted 8 June 2000

Resonance fluorescence has been observed for spectroscopically pure SiO2, at 288.2 nm by high power optical pumping, using flash photolysis technique. Absorption and emission bands are recorded photographically in the UV-region. Absorption and emission bands are observed without fine structure at room temperature.

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