Published December 16, 2021 | Version v1
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RAW data for Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique

Authors/Creators

  • 1. University of Latvia

Description

Raw data for the "Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique" paper.

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RAW data for Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique.zip

Files (163.0 MB)

Additional details

Related works

Has part
DOI https://doi.org/10.1039/D1NA00390A (Handle)

Funding

European Commission
HiTIMe - High Frequency Topological Insulator devices for Metrology 766714