Published October 13, 2021
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Impact of rapid thermal processing on bulk and surface recombination mechanisms in FZ silicon with fired passivating contacts
Authors/Creators
- 1. EPFL, PV-lab
- 2. CSEM
Description
Data underlying the article
Notes
Files
b-data.zip
Additional details
Related works
- Is source of
- Journal article: 10.1016/j.solmat.2022.111647 (DOI)
Funding
- Swiss National Science Foundation
- Interfaces and Metallisation of PAssivating ConTacts (IMPACT) 200021_185064