Published January 10, 2020
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Trace element analysis in colloidal silica by ICP-OES
Description
The sample is digested by acid and/or diluted, and is thereafter analyzed for trace elements by inductively coupled plasma optical emission spectroscopy (ICP-OES). The analyzed elements are: Ag, Al, Ba, Ca, Cd, Co, Cr, Cu, Fe, K, Mg, Mn, Mo, Na, Ni, Pb, SO4, Sn, Sr, Ti, V, Zn och Zr. For the analysis of boron, the sample is prepared and analyzed according to instruction SI055.
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7_SOP_Nouryon_ICP-OES.pdf
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