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Published May 11, 2021 | Version v2
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Authors/Creators

  • 1. IBM Research Europe ; University of Zurich and ETH, Switzerland
  • 2. IBM Research Europe, Switzerland
  • 3. University of Zurich, Switzerland

Description

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Notes

When using this dataset, please cite the original publication as follows: Dennler, N., Foncubierta-Rodriguez, A., Neupert, T., & Sousa, M. (2021). Learning-based defect recognition for quasi-periodic HRSTEM images. Micron, 146(July 2020), 103069. https://doi.org/10.1016/j.micron.2021.103069

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Additional details

Related works

Is cited by
Journal article: 10.1016/j.micron.2021.103069 (DOI)

Funding

European Commission
DESIGN-EID - Defect Simulation and Material Growth of III-V Nanostructures- European Industrial Doctorate Program 860095
European Commission
PARATOP - New paradigms for correlated quantum matter: Hierarchical topology, Kondo topological metals, and deep learning 757867