Published July 13, 2021
| Version v1
Dataset
Open
Structure-Dependent Influence of Moisture on Resistive Switching Behavior of ZnO Thin Films - Dataset
Authors/Creators
- 1. Istituto Nazionale di Ricerca Metrologica (INRiM)
- 2. RWTH Aachen University
- 3. Politecnico di Torino
- 4. Forschungszentrum Jülich
Description
This is the dataset of "Structure-Dependent Influence of Moisture on Resistive Switching Behavior of ZnO Thin Films"
Notes
Part of this work was supported by the European project MEMQuD, code 20FUN06, funder ID: 10.13039/100014132.
This project (EMPIR 20FUN06 MEMQuD) has received funding from the EMPIR programme co-financed by the Participating States and from the European Union's Horizon 2020 research and innovation programme.
Files
Figure_2a - Influence of moisture on electroforming (CVD film).txt
Files
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Additional details
Related works
- Is cited by
- Journal article: 10.1002/admi.202100915 (DOI)