Published May 8, 2020
| Version v1
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Model and Controller Design for High-speed Atomic Force Microscope Imaging and Autotuning
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- 1. Massachusetts Institute of Technology
Description
Proceedings of the ASPE Spring Topical Meeting on Design and Control of Precision Mechatronic Systems
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Model and Controller Design for High-speed Atomic Force Microscope Imaging and Autotuning.pdf
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