BAM reference data: EDS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a)

The EDS spectra are given in the EMSA/MAS format as defined by ISO 22029:2012 Microbeam analysis — EMSA/MAS standard file format for spectral-data exchange. The exact locations of the sample areas measured with EDS are indicated in the SEM images.

For further information please look at:

- Radnik, J. Kersting, R., Hagenhoff, B., Bennet, F., Ciornii, D.; Nymark, P., Grafström R. and Hodoroaba, V.- D. Nanomaterials 2021, 11, 639. https://doi.org/10.3390/nano11030639, and

- Radnik, Jörg. (2021). BAM reference data: XPS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) [Data set]. Nanomaterials. Zenodo. http://doi.org/10.5281/zenodo.4986068

Measurement conditions:

The EDS analysis in the present study has been performed with a QUANTAX 400 EDS system (BRUKER, Berlin, Germany), which is equipped with an SDD (Silicon Drift-Detector) of the 10 mm2 nominal area. An excitation of 10 keV was applied for the analysis of the titania samples prepared as a thick dry powder layer on an aluminum stub, so that the substrate cannot be coexcited. The analysis  reas were selected as large as 5 x 5 µm² on sample agglomerates of about 1eng0 µm size.