Journal article Open Access
Rodriguez Condia, Josie Esteban;
Goncalves, Marcio;
Azambuja, Jose Rodrigo;
Sonza Reorda, Matteo;
Sterpone, Luca
Preprint version of the manuscript presented at 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2020) and later published at Microelectronics Reliability, Elsevier, Volume 114, November 2020, 113768.
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