Published January 8, 2021 | Version v1
Dataset Open

The Role of Lengthscale in the Creep of Sn-3Ag-0.5Cu Solder Microstructures

Authors/Creators

  • 1. Imperial College London

Description

The data released here is for the paper "The Role of Lengthscale in the Creep of Sn-3Ag-0.5Cu Solder Microstructures". DOI: : 10.1007/s11664-020-08697-4

Tianhong Gu1*, Christopher M. Gourlay1, and T. Ben Britton1

  1. Department of Materials, Imperial College London, SW7 2AZ. UK

*Corresponding author: t.gu15@imperial.ac.uk, +44 20 7594 2634

*.bcf = Bruker BCF data for full EBSD map to plot EBSD maps
*xlsx. = spreadsheet of graphical data for plots in Fig2 and Fig 4 (creep curves)
*.tif = images used to to build up Figures (the figures are presented in the powerpoint)

The data bundle was prepared by Tianhong Gu

Files

Data_JEM_101220.zip

Files (215.4 MB)

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