Published November 6, 2020
| Version v1
Dataset
Open
Discrimination of aluminum from silicon by electron crystallography with the JUNGFRAU detector
Creators
- 1. Paul Scherrer Institut
- 2. Paul Scherrer Institut / ETH Zurich
- 3. University of Vienna
Description
Electron diffraction data of two different aluminosilicates, zeolite A and albite. They were used to implement the JUNGFRAU detector (PSI Switzerland) at Vienna University, and develop the software for data conversion and data collection. The archives also contain the XDS files for processing. The metadata of the CBF-files mostly not filled in properly (pixel size and wavelength only are correct). Please refer to the XDS.INP files for experimental parameters (oscillation width, detector distance, etc.). The structural CIF files have been submitted to the Cambridge Structural Database CSD.
Files
Files
(5.1 GB)
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md5:8db720140d678be8fb0568449e6a9cec
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md5:a809bb68947eee051e51b3750b738668
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11.0 MB | Download |
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md5:f66be2d0ae2f0cce3f01a7e5e2e32011
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561.8 MB | Download |
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md5:961a47da4b0bf9f9adba8c4097fed329
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md5:254c9f02b61464da5c54b363998790ab
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md5:e7dd88186467b6a4486c9d22a38a41fe
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8.3 MB | Download |
Additional details
Funding
- Applications of Electron Nanocrystallography for Organic and Macromolecular Structure Determination 200021_169258
- Swiss National Science Foundation