Discrimination of aluminum from silicon by electron crystallography with the JUNGFRAU detector

Electron diffraction data of two different aluminosilicates, zeolite A and albite. They were used to implement the JUNGFRAU detector (PSI Switzerland) at Vienna University, and develop the software for data conversion and data collection. The archives also contain the XDS files for processing. The metadata of the CBF-files mostly not filled in properly (pixel size and wavelength only are correct). Please refer to the XDS.INP files for experimental parameters (oscillation width, detector distance, etc.). The structural CIF files have been submitted to the Cambridge Structural Database CSD.