Dataset Open Access
The anisotropy in the optical constants of quartz crystals for soft X-rays
Andrle, Anna; Hönicke, Philipp; Vinson, Jon; Quintanilha, Richard; Saadeh, Qais; Heidenreich, Sebastian; Scholze, Frank; Soltwisch, Victor
The refractive index of a y-cut SiO2 crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV. In the datasets the 1-delta and beta values for the (100) and (001) direction of the SiO2 crystal for the different energies are provided.
Files
(60.2 kB)
| Name | Size | |
|---|---|---|
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delta_beta_SiO2_001.txt
md5:7cee66545f5c6a81a1c39f9baff6204d |
30.1 kB | Download |
|
delta_beta_SiO2_100.txt
md5:a38544e555454673ff5cb1b4398765d3 |
30.1 kB | Download |
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Indexed in
- Publication date:
- October 22, 2020
- DOI:
-
- Keyword(s):
- refractive index SiO2 crystal anisotropy
- Grants:
-
European Commission:
- TAPES3 - Technology Advances for Pilotline of Enhanced Semiconductors for 3nm (783247)
- Related identifiers:
- Supplement to
- License (for files):
- Creative Commons Attribution 4.0 International