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The anisotropy in the optical constants of quartz crystals for soft X-rays

Andrle, Anna; Hönicke, Philipp; Vinson, Jon; Quintanilha, Richard; Saadeh, Qais; Heidenreich, Sebastian; Scholze, Frank; Soltwisch, Victor

The refractive index of a y-cut SiO2 crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV. In the datasets the 1-delta and beta values for the (100) and (001) direction of the SiO2 crystal for the different energies are provided.

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delta_beta_SiO2_001.txt
md5:7cee66545f5c6a81a1c39f9baff6204d
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delta_beta_SiO2_100.txt
md5:a38544e555454673ff5cb1b4398765d3
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