Conference paper Open Access
Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
Glorieux, Maximilien;
Evans, Adrian;
Lange, Thomas;
In, A-Duong;
Alexandrescu, Dan;
Polo, Cesar Boatella;
Alía, Rubén García;
Tali, Maris;
Ortega, Carlos Urbina;
Kastriotou, Maria;
Martı́nez, Pablo Fernández;
Cavrois, Véronique Ferlet
Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity.
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- Publication date:
- December 20, 2018
- DOI:
-
- License (for files):
- Creative Commons Attribution Non Commercial No Derivatives 4.0 International