Conference paper Open Access

Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation

Glorieux, Maximilien; Evans, Adrian; Lange, Thomas; In, A-Duong; Alexandrescu, Dan; Polo, Cesar Boatella; Alía, Rubén García; Tali, Maris; Ortega, Carlos Urbina; Kastriotou, Maria; Martı́nez, Pablo Fernández; Cavrois, Véronique Ferlet

Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity.

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