CAN DIODE LASER SUPPORT REMINERALIZATION POTENTIAL OF CPP-ACPF ON DEMINERALIZED ENAMEL?.

Recent studies recognized that incorporation of fluoride into the Casein Phospho-Peptide - Amorphous Calcium Phosphate (CPP-ACP) structure forming (CPP-ACPF): (GC MI paste Plus), produced greater remineralization than the CPP-ACP alone. The aim of the present study was toassess the efficacy of diode laser irradiation on re- mineralization potential of CPP-ACPF cream on induced human surface enamel demineralization, using Scanning Electron Microscope- Energy Dispersive X- ray analysis SEM-EDAX analyser. Materials & Methods: forty intact premolars were collected and thirty of them were immersed in a demineralizing solution for 10 weeks to induce caries like lesions and then were divided into four groups, each consist of 10 teeth. In C-ve group the specimens were immersed in normal saline only C+ve group specimens were subjected only to demineralizing solution. In Group (CPP-ACPF alone) this group was treated with application of a sufficient thickness of CPP-ACPF cream for 4 minutes. In group (CPP-ACPF plus 970nm diode laser), the demineralized enamel was covered with CPP-ACPF cream for 4 minutes and (970nm, 1mw diode laser) was employed at the last one minute of cream application with distance of 5mm from the tooth surface. Results:Although the highest mean total weight percentages of C, Ca, P, F% wt and Ca/P ratio resulting from the EDAX analysis of enamel surface was observed in group (CPP-ACPF plus 970nm diode laser). However, ANOVA displayed no significant differences was foundbetween the C+ve and experimental groups(p>0.05). Conclusion:The exposure to the demineralizing agent significantly decreased the calcium, phosphorous and fluoride level of enamel surface and altered enamel surface morphology. When demineralized enamel was followed by CPP-ACPF alone a better morphological result as well as increased ionic wt% was observed compared to C+v group.CPP-ACPF plus 970nm laser application resulted in more reduction in morphological enamel defects compared to C+ve group.