Published December 16, 2018 | Version v1

Formation of extended thermal etch pits on annealed Ge wafers -DataSet

Description

Dataset supporting the publication: 10.1016/j.apsusc.2018.08.075 arXiv:1809.03404, including optical microscopy, atomic force microscopy, scanning electron micoscopy

 

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Funding

European Commission
FLASH - Far-infrared Lasers Assembled using Silicon Heterostructures 766719