Data for "Giant Strain Tunability in Polycrystalline Ceramic Films via Helium Implantation"

The XRD theta(2theta) scans are saved with the following name pattern :

Sample_substrate_configuration_zone_dose_scan_number

Sample = BFMTO for co-doped BiFeO3 with 5% Mg and Ti
Sample = BFO for pure BiFeO3 film

substrate = MgO, SiO2 (for fused silica), or Sapphire

configuration = OOP (out-of-plane geometry) or IP (in-plane geometry)

zone = zone number from 0 to 5

dose = 0, 2E14, 5E14, 1E15, 2E15 or 5E15 He.cm-2

Note that the BFMTO_SiO2_IP has more scans. We collected them with a 3x lower resolution, they are to be averaged to obtain the same resolution as the other scans.

For the electrical measurements data :

The P(E) loops and I(V) curves for all measured doses are all in the two files :

MIM_configuration : contains the electrical measurements in the form (V (kV/cm), I (µA), P (µC.cm-2)) done in Metal-Insulator-Metal configuration (OOP field)

IDE_configuration : contains the electrical measurements in the form (V (kV/cm), I (µA), P (µC.cm-2)) done with Inter-Digitated Electrodes configuration (IP field)

For the low-field conductivity measurements, the data for both MIM and IDE configurations are saved in the file "Low-field_J-V_curves". The 1st six columns for MIM configuration (doses 1e14, 5e14 and 1e15) and the last six columns for the IDE configuration (doses 1e14, 5e14 and 1e15).