In-situ scanning gate imaging of individual two-level material defects in live superconducting quantum circuits

Data taken by scanning gate microscopy of two level systems defects in live superconducting circuits. https://arxiv.org/abs/2408.16660.

We acknowledge the project (23FUN08 MetSuperQ) which has received funding from the European Partnership on Metrology, co-financed from the European Union’s Horizon Europe Research and Innovation Programme and by the Participating States.