Skip to main
Zenodo home
Communities
My dashboard
Log in Sign up

Scheduled maintenance: On Tuesday, November 3rd, Zenodo will be unavailable between 08:00 and 08:15 UTC for an infrastructure upgrade.

Published July 1, 1988 | Version v1
Journal article Open

Effect of Random Errors in Planar Near-field Measurement

Authors/Creators

  • Newell, Allen C.
  • Stubenrauch, Carl F.

Description

n/a

Files

article.pdf

Files (403.7 kB)

Name Size
article.pdf
md5:ac01c8bd1d0410772d7ee2c96ff21e97
403.7 kB Preview Download
110
Views
203
Downloads
Show more details
All versions This version
Views

Total views

110 110
Downloads

Total downloads

203 202
Data volume

Total data volume

84.0 MB 83.6 MB

More info on how stats are collected....

Versions

External resources

Indexed in
  • OpenAIRE

Communities

Details

DOI
10.1109/8.1178
DOI Badge

DOI 

10.1109/8.1178

Markdown 

[![DOI](https://zenodo.org/badge/DOI/10.1109/8.1178.svg)](https://doi.org/10.1109/8.1178)

reStructuredText 

.. image:: https://zenodo.org/badge/DOI/10.1109/8.1178.svg
  :target: https://doi.org/10.1109/8.1178

HTML 

<a href="https://doi.org/10.1109/8.1178"><img src="https://zenodo.org/badge/DOI/10.1109/8.1178.svg" alt="DOI"></a>

Image URL 

https://zenodo.org/badge/DOI/10.1109/8.1178.svg

Target URL 

https://doi.org/10.1109/8.1178
Resource type
Journal article
Publisher
Zenodo

Rights

License
cc0-1.0 icon Creative Commons Zero v1.0 Universal
CC0 waives copyright interest in a work you've created and dedicates it to the world-wide public domain. Use CC0 to opt out of copyright entirely and ensure your work has the widest reach. Read more

Citation

Export

Technical metadata

Created
June 4, 2018
Modified
August 2, 2024

About

  • About
  • Policies
  • Infrastructure
  • Principles
  • Projects
  • Roadmap
  • Contact

Blog

  • Blog

Support

  • Help
  • FAQ

Developers

  • REST API
  • OAI-PMH

Contribute

  • GitHub
  • Donate

Funded by

Powered by CERN Data Centre & InvenioRDM

  • Status
  • Privacy policy
  • Cookie policy
  • Terms of Use

This site uses cookies. Find out more on how we use cookies