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Published December 1, 1994 | Version v1
Journal article Open

Radiation-induced defect introduction rates in semiconductors

Authors/Creators

  • Drevinsky, P. J.
  • Frederickson, A. R.
  • Elsaesser, D. W.

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n/a

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DOI
10.1109/23.340523
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10.1109/23.340523

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Created
June 4, 2018
Modified
August 2, 2024

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