Dynamic IEEE Test Systems for Transient Analysis

In this paper, the dynamic models and the dynamic parameters for sixth-order full machine models (i.e., machine, exciter, and governor) as well as for the condensers and motors contained in the IEEE 14-, 30-, 39-, 57-, and 118-bus systems are defined based on typical data provided in [9]. The topology of the proposed dynamic IEEE test bed systems was slightly altered from the default one by adding new buses with a lower voltage level for the generators, condensers, and motors, in order to be compliant with the rated voltage level of the dynamic models provided in [9]. The procedure followed in this paper for including dynamic models into a system can be generalized for several systems, assuming that the rated power of the generators, motors, and condensers are known. The dynamic test systems complement the existing steady-state systems. Based on the simulation results, it can be concluded that the dynamic models with the proposed typical parameters are reliable since the dynamic response of the IEEE modified test systems follows the expected behavior of actual systems under contingencies. It is shown that the proposed governor models play a crucial role in the maintenance of the system frequency, even under severe faults. Moreover, the voltage magnitudes of the buses for all of the test systems are preserved close to their prefault values in the presence of the proposed exciter models. In the case of the rotor angle stability, it is obvious that the generators maintain synchronism between them after the occurrence of a fault.