ATMOC
Published March 6, 2024 | Version v1
Dataset Open

Complex Refractive Index of Indium Tin Oxide Thin Films obtained by Variable Angle Spectroscopic Ellipsometry

Authors/Creators

  • 1. ROR icon Johannes Kepler University of Linz
  • 2. ROR icon Physikalisch-Technische Bundesanstalt
  • 3. Bundesanstalt für Materialforschung und -prüfung
  • 4. Universität Köln

Contributors

  • 1. ROR icon Johannes Kepler University of Linz

Description

The two uploaded datasets are published in the following article:

Minenkov, Hollweger, Duchoslav, Erdene-Ochir, Weise, Ermilova, Hertwig, Schiek.
Monitoring the Electrochemical Failure of Indium Tin Oxide Electrodes via Operando Ellipsometry Complemented by Electron Microscopy and Spectroscopy.
ACS Appl. Mater Interfaces 16 (2024) 9517.

https://doi.org/10.1021/acsami.3c17923

Dataset "NK ITO layer XY5S.txt" contains the complex refractive index of an ITO layer on glass type XY15S purchased from Xinyan Technology LTD.

Dataset "NK graded ITO layer.txt" contains the complex refractive index of a sputtercoated, graded ITO layer on a SiO2-Si-wafer.

Files

NK graded ITO layer.txt

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md5:494d0421c3093ddf8a43dfd152ecfd1d
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md5:d7b7445c25463186e1ed0b90c73cd4b7
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Additional details

Related works

Is published in
Journal article: 10.1021/acsami.3c17923 (DOI)