XPS spectra for Li intercalated few-layer MoS2 films
- 1. CNR-IOM, Istituto Officina dei Materiali, TriesteCNR-IOM, Istituto Officina dei Materiali, Trieste, Italy
- 2. Institute of Electrical Engineering, SAS, Bratislava, Slovakia
Description
Description
Dataset for synchrotron-based x-ray photoelectron (XPS) spectra of Li doped MoS2 nanofilms grown on c-plane sapphire substrate by two techniques: thermally assisted conversion (TAC) and pulsed laser deposition (PLD). Reference spectra for undoped MoS2 were measured on a commercial MoS2 powder sample.
Data formats
The XPS datasets are available in two formats.
- VAMAS (ASCII ISO 14976).
- Plain text column files: Double-column files (dat) and corresponding metadata files (txt).
Methods
Sample preparation
MoS2 nanofilms were synthesized using two techniques:
- Thermally assisted conversion (TAC) of 1-nm-thick Mo by one-zone sulfurization.
- Pulsed laser deposition (PLD).
Lithium was incorporated into the as-prepared MoS2 films by solid-state diffusion during the subsequent sulfurization process, where a part of sulfur powder was replaced by lithium sulfide (Li2S) as a source of Li.
Notes
Data were acquired at BACH beamline, Elettra synchrotron facility. Access was provided by IOM-CNR in Trieste (Italy) within the framework of the NFFA-Europe Pilot Transnational Access Activity, proposal ID101.
Files
XPS-Li-MoS2-PLD-synthesis.zip
Files
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Additional details
Related works
- Is supplement to
- Journal article: 10.1063/5.0191046 (DOI)
- Journal article: https://zenodo.org/records/10813107 (Other)