X-ray beam characterization of an aberration-corrected pair of multilayer Laue lenses with ptychography

This data set is split over three zip archives. Each archive contains a scanning coherent X-ray diffraction (ptychography) data set recorded at an X-ray energy of 16.2 keV. A crossed pair of multilayer Laue lenses (MLL) is used to focus the beam and scan a Siemens star test sample. Each data set includes a configuration file and scan position file. In addition, the final result of the obtained ptychographic reconstruction is included.

Description of the three data sets:

• scan_00086: X-ray beam characterization of the MLL. On this data set the design of the refractive phase corrector was based upon.
• scan_00338: X-ray beam characterization of the MLL four days after scan_00086 without phase corrector.
• scan_00346: X-ray beam characterization of the MLL with refractive phase corrector.

Additional information:

The diffraction patterns can be found in the 'eiger4m_01' folder. They are split up over multiple h5 files and located in the group '/entry/data/data'. The assignment of diffraction patterns to scan positions can be found in the positions.txt file. All relevant input parameters for ptychography are located in the 'input' group in the ptycho.conf files. The reconstruction results are in the European Data Format (EDF).

The data set has been published in:

F. Seiboth, A. Kubec, A. Schropp, S. Niese, P. Gawlitza, J. Garrevoet, V. Galbierz, S. Achilles, S. Patjens, M. E. Stuckelberger, C. David, and C. G. Schroer, "Rapid aberration correction for diffractive X-ray optics by additive manufacturing," Optics Express 30(18), 31519 (2022).