Published August 25, 2023
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EMPIR 19ENG06 HEFMAG Technical report on new scanning probe technique for imaging dynamic domain processes
Description
Technical report on a new MFM-based scanning probe technique for imaging dynamic domain processes applied to grain-oriented Fe-3%Si sheets
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EMPIR 19ENG06 HEFMAG Technical Report on new scanning probe technique.pdf
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(1.5 MB)
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