.(E)XACT CORRECTION OR (P)HASE CORRECTION ONLY: E
[Specify filter mode. Enter 'E' for combined phase and
amplitude correction, or 'P' for phase correction only.
cf Smith and Kistler paper.]
.SHADOWING ANGLE THETA: 45.
[Enter shadowing elevation angle with respect to plane of
specimen, i.e. 90 degrees for perpendicular shadowing.]
.DEPOSIT THICKNESS D: 5
[Enter vertical thickness of metal deposit (parameter D in
Smith/Kistler paper), in sampling units.]
.EPSILON: 0.01
[Epsilon is the smallest value permitted for ABS(1-exp(-2PI Ra))
so that unreasonable noise amplification is avoided.]
.SHADOWING AZIMUTH PHI: 30.
[Enter azimuth of base line of shadowing vector, in
degrees. The azimuth is measured with respect to the
direction of the x-axis.]