Dataset: The effect of a keyhole defect on strain localisation in an additive manufactured titanium alloy
Authors/Creators
Description
This is the dataset used in the following publication:
S. Cao, R. Thomas, A.D. Smith, P. Zhang, L. Meng, H. Liu, J. Guo, J. Donoghue, D. Lunt, The effect of a keyhole defect on strain localisation in an additive manufactured titanium alloy, Journal of Materials Research and Technology, https://doi.org/10.1016/j.jmrt.2024.11.237
Contained in this dataset are:
A Jupyter notebook which uses the open-source DefDAP Python package (https://github.com/MechMicroMan/DefDAP) to open enclosed HRDIC and EBSD data for two regions in an SLM Ti64 sample, one around a keyhole defect and one ~1mm away in the bulk.
Please use the 'master' version of DefDAP: https://github.com/MechMicroMan/DefDAP/
Publication abstract:
The influence of a keyhole defect on local deformation behaviour in additive manufactured Ti-6Al-4V was investigated by comparing it to a representative bulk region without a defect. High resolution digital image correlation (HRDIC) was used to measure the differences in strain localisation at the microstructural length-scale. A nanoscale speckle pattern was used to allow small changes in strain to be detected and resolved within a single individual lamella and at pre-existing crack locations around the defect. Strain localisation was observed around the defect and formed well below the macroscopic yield stress. In contrast, minimal deformation was found in the bulk at this stress level. Following further deformation into the plastic regime, the strain localisation around the keyhole became more heterogenous with a distinct strain field. A large amount of strain localisation and <c+a> slip was observed either side of the defect normal to the loading direction compared to relatively little in the regions close to the defect in line with the loading direction. This HRDIC observation was consistent with finite element analysis of the expected strain fields around the defect both below and above the yield point. Furthermore, micro-cracks were observed in αp/αp and αp/βt interfaces in both regions with the more pronounced strain fields around the defect leading to an increased number of long micro-cracks than in the bulk. The formation mechanisms of micro-cracks have been discussed, emphasising the role of localised strain caused by the defect.
Files
Defect DefDAP.zip
Files
(2.3 GB)
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md5:a8a800e3c15f9fbb9bc59927ad4c8856
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2.3 GB | Preview Download |
Additional details
Related works
- Is supplement to
- Publication: 10.1016/j.jmrt.2024.11.237 (DOI)
- Requires
- Software: 10.5281/zenodo.6346255 (DOI)